Introduction
This laboratory provides micro surface observations based on back scattered electron images (BSEI), secondary electron images (SEI), CL images，and energy spectrum (EDS) analysis of solid samples. This Field Emission Scanning Electron Microscope (FE-SEM TESCAN Mira3) designed by TESCAN Company is equipped with a high brightness schottky emitter Electron Gun, retractable BSE detector(YAG Crystal), SE-ET type SE detector and CL Detector. Technic specification: SE resolution 1.2nm (30KV,high vacuum)，BSE resolution 2.9nm (15KV, low vacuum). This device is also combined with Energy Dispersive X-ray Microanalysis (Ultim Max40 EDS) designed by Oxford Company, with energy resolution 127eV, and the range of analysis elements B-U.
Contact Person： Zhang Lingmin
Email : zlm@tongji.edu.cn